Composition and thickness of surface layer on molybdenum tips for scanning tunnelling microscopy (STM) studied by SEM/AES/(AR)XPS
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چکیده
منابع مشابه
Composition and Thickness of Surface Layer on Molybdenum Tips for Scanning Tunnelling
A combination of SEM, AES and angle-resolved XPS (ARXPS) has been applied to analyse the distribution of chemical compounds in the surface region of electrochemically etched molybdenum tips and to determine the contamination layer thickness. Carbon monoxide, graphite, molybdenum carbide and molybdenum oxide were found to be the main surface contaminants on molybdenum tips. Auger line profiling ...
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ژورنال
عنوان ژورنال: Surface and Interface Analysis
سال: 1992
ISSN: 0142-2421,1096-9918
DOI: 10.1002/sia.740190121